Dimension Edge 扫描探针显微镜系统
性能介绍
仪器简介:
The Dimension® Edge™ Atomic Force Microscope (AFM) System incorporates Veeco’s latest technology advances to provide the highest levels of performance, functionality, and accessibility in its class. Based on the ultimate Dimension Icon® platform, the Edge System has been designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, all at price points well below expectations for such performance. In addition, integrated visual feedback and preconfigured settings enable expert-level results simply and consistently, making the most advanced large-sample atomic force microscopy capabilities and techniques available to every facility and user.
技术参数:
X-Y scan range: 90μm x 90μm typical, 85μm minimum
Z range: 10μm typical in imaging and force ramp modes, 9.5μm minimum
Vertical noise floor <50pm RMS in appropriate environment, typical imaging bandwidth (up to 625Hz)
XY position noise (closed loop) <0.5nm RMS typical imaging bandwidth (up to 625Hz)
Z position sensor noise level (closed loop): <0.2nm RMS typical imaging bandwidth (up to 625Hz)
Sample size/holder: 150mm vacuum chuck, 15mm thick; up to 40mm thick with optional frame spacer
Motorized positioning stage (X-Y axis): 150mm x 150mm inspectable area; Programmable for multi-site measurements
Microscope optics: 5-megapixel digital camera; 180μm to 1465μm viewing area; digital zoom and motorized focus
Signal access: Configurable I/O signal access built into controller; Includes customizable signal routing, digital feedback, and dual digital lock-in
Single point spectroscopy: Three-axis closed loop control for point-and-shoot positioning and ramping; Spring constant calibration with built-in thermal tune;
Sample temperature control: -35 to +250°C with optional heater/cooler accessory; s gas purging capability
主要特点:
• Best Value Closed-Loop Dimension AFM
• Accurate, High-Resolution Results Even Faster
• Solutions for All Applications on Any Sample
• Advanced Nanoscale Capabilities for Beginners and Experts
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